Experimental work

Silicon nanowires fabricated by electroless etching

I have fabricated nanowires using the metal catalysed electroless etching process described in Peng et al., Adv. Funct. Mater., vol. 16, 387-394, 2006.

Spectroscopic Ellipsometry

As part of an undergraduate summer research project under the guidance of Prof. Sandip Ghosh (TIFR Mumbai), I setup a spectroscopic ellipsometry experiment using a photoelastic modulator. Ellipsometry measures the change in polarization of circularly polarized light incident on a surface, and hence deduces information about the refractive index of the material of the surface. We used this setup to measure the energies of E1 and E1+Delta1 transitions in GaAs.